SAKI bar

SAKI is specifically designed for simulating and analyzing Kikuchi patterns with Selected Area Electron Diffraction (SAED), incorporating a double diffraction effect. 

  • Employ SAKI for simulating Kikuchi lines and SAED patterns with a double diffraction effect.
  • Utilize a user-friendly index system for Kikuchi lines and SAED patterns.
  • Convert between Miller and Miller-Bravais indices.
  • Perform drag-and-drop actions to load experimental diffraction patterns (.jpg, .png and .tif).
  • Align, resize, rotate, and invert experimental SAED/Kikuchi patterns.
  • Compare experimental SAED patterns with three Kikuchi pairs (three Kikuchi poles) or two Kikuchi pairs (single Kikuchi pole) to determine precise crystal phase orientation.
  • Analyze experimental SAED patterns to detect forbidden diffraction due to the double diffraction effect.
  • Save SAED patterns with Kikuchi lines in .tif, .jpg, .png, and .gif formats.
  • Create labeled figures suitable for publication.
  • Access a periodic table of elements with a molecular mass calculator.
  • Access a table listing the number and symbols of the 230 space groups.
SAKI figure

 (a) Simulated spot pattern in kinematical diffraction, (b) with a double diffraction effect. (c) Simulated Kikuchi pattern supposed on the experimental pattern (d) the simulated pattern only for clarity.